中國碳素的問題，透過圖書和論文來找解法和答案更準確安心。 我們找到下列問答集和資訊懶人包

碳材料科學與工程：表征（英文）

為了解決中國碳素的問題，作者康飛宇（主編） 這樣論述：

碳材料由於其結構多樣性，導致其性能多樣化，因而應用領域廣闊，碳材料研究已受到全球材料科學界、物理學界、化學界的廣泛關注。本書系統介紹了碳材料表征技術及應用，包括 X射線粉末衍射、小角 X射線散射、透射電鏡、掃描電子顯微鏡、圖像分析、拉曼光譜、X射線光電子能譜、磁電阻、電化學性能、氣體吸附/解吸等溫線、熱分析、表面官能團滴定測定、程序升溫脫附技術。本書讀者對象為材料領域的科技人員、研究生和高校教師。本書以英文著述，並與 Elsevier出版集團合作已在海外出版。Michio Inagaki教授，日本北海道大學榮休教授。擔任過日本碳素學會主席，JSPS117委員會主席，Carbon雜志副主編。獲得

過美國和中國碳素學會、日本陶瓷學會學術貢獻獎。出版8本書，發表700多篇學術論文。Feiyu Kang（康飛宇），教授，清華大學深圳研究生院院長。現任SCI刊物《Carbon》顧問編委，SCI刊物《新型炭材料》副主編，層間化合物系列國際會議（ISIC）國際顧問委員會委員。曾獲國家發明獎等多項獎勵。出版中英文專著5部，在國內外發表論文200多篇。 List of ContributorsPrefaceAcknowledgmentsCHAPTER 1 Introduction.1Michio Inagaki， Feiyu Kang1.1 Carbon Materials.11.

2 Characterization of Carbon Materials.31.3 Structure of the Present Book.5References.6CHAPTER 2 X—ray Powder Diffraction.7Norio Iwashita2.1 Introduction.72.2 X—ray Diffraction Pattern of Carbon Materials.82.3 Parameters Determined by X—ray Diffraction.102.4 Instrumentation.112.5 Specifications for

Measurement.142.5.1 Preparation of Sample for X—ray Measurements.142.5.2 Measurement and Intensity Correction of DiffractionProfiles.142.5.3 Correction of Diffraction Angle With InternalStandard.162.5.4 Determination of Full Width at Half MaximumIntensity.172.5.5 Accuracy of the Values Determined.18

2.6 Degree of Graphitization.182.7 Key Issues for Measurement.212.7.1 Diffraction Pattern.212.7.2 Use of Internal Standard.212.7.3 Use of Thin Sample Holder.222.7.4 Indexing the Diffraction Line.232.7.5 Separation into Component Profiles.232.8 Concluding Remarks.24References.24CHAPTER 3 Small—Angle

X—ray Scattering.27Katsuya Fukuyama， Yoshikiyo Hatakeyama3.1 Introduction.273.2 Fundamentals.283.3 Key Issues for the Measurements.333.4 Applications for Carbon Materials.353.4.1 Porous Carbon Fibers.353.4.2 Glass—Like Carbons.363.4.3 Mesocellular Foam Carbons （Silica—TemplatedCarbons）.383.4.4 Open

Pores Formed by Air Oxidation.403.5 Concluding Remarks.42References.42CHAPTER 4 Transmission Electron Microscopy.45Sylvie Bonnamy， Agne`s Oberlin4.1 Introduction.454.2 Modes of Transmission Electron Microscopy.464.2.1 Diffracting Mode.474.2.2 Imaging Modes.474.3 Key Issues for Observation.484.3.1 Ob

ject Thickness （Weak Phase Object）.484.3.2 Contrast Transfer Function of the TransmissionElectron Microscope.494.3.3 Diffusion Contrasts.544.3.4 Fresnel Fringes， ie， Edge Fringes.544.5 Applications for Carbon Materials.564.5.1 Transmission Electron Microscopy Modes to StudyCrystallinity of Carbon Ma

terials.564.5.2 Transmission Electron Microscopy Modes inthe Study of Carbonization and Graphitization.624.6 Conclusions.69References.69Further Reading.70CHAPTER 5 Scanning Electron Microscopy.71Akira Yoshida， Yutaka Kaburagi， Yoshihiro Hishiyama5.1 Introduction.715.2 Instrumentation and Resolving P

ower.725.2.1 Instrumentation.735.2.2 Magnification and Resolving Power of theScanning Electron Microscope.755.2.3 Edge Effects Appearing in SE Mode Images.765.3 Specimen Preparation.775.4 Observation With the Out—Lens Objective Lens System.795.5 Observation With the Snorkel Objective Lens System.815

.6 Observation With the In—Lens System.825.7 Electron Channeling Effect.835.7.1 Electron Channeling Effect for Kish Graphite.835.7.2 Electron Channeling Pattern for Kish Graphiteand HOPG Specimens.865.7.3 Mapping and Crystal Grain Size Evaluation.885.8 Concluding Remarks.91References.92CHAPTER 6 Ima

ge Analysis.95Kyoichi Oshida6.1 Introduction.956.2 Image Analysis Methods.966.2.1 Process of Image Analysis.966.2.2 Analysis of Space Frequency.976.2.3 Three—Dimensional Transmission ElectronMicroscopy.1006.2.4 Software for the Analysis.1006.3 Structure Analysis Through Transmission ElectronMicrosco

py.1016.3.1 Cup—Stacked Type Carbon Nanotubes.1016.3.2 Carbon Nanotubes Loaded With Metal Particles.1046.3.3 Thin Graphite.1086.3.4 Disordered Carbon.1086.4 Texture Analysis Through Scanning ElectronMicrographs.1136.5 Texture Analysis Through Optical Micrographs.1166.6 Concluding Remarks.120Referenc

es.121CHAPTER 7 Raman Spectroscopy.125Yutaka Kaburagi， Akira Yoshida， Yoshihiro Hishiyama7.1 Introduction.1267.2 Fundamentals.1267.3 Key Issues for the Measurements.1297.3.1 Laser Probe Sampling Depth.1297.3.2 Polarization of Laser Light.1297.3.3 Sampling Area.1317.3.4 Temperature.1327.3.5 Eliminati

on of Background Intensity.1327.3.6 Excitation Energy Dependence of D Band.1337.3.7 Calibration of Raman Frequency.1347.3.8 Equipment.1367.4 As a Measure for Structure Characterization.1387.4.1 G Band.1387.4.2 D and Do Bands.1417.5 Concluding Remarks.149References.150……CHAPTER 8 X—ray Photoelectron

Spectroscopy.153CHAPTER 9 Magnetoresistance.173CHAPTER 10 Electrochemical Performance.205CHAPTER 11 Gas Adsorption／Desorption Isotherm for Pore Structure Characterization.227CHAPTER 12 Thermal Analysis.249CHAPTER 13 Titration Method for the Identification of Surface Functional Groups.273CHAPTER 14 T

emperature Programmed Desorption.287Index.307

中國碳素進入發燒排行的影片

活性碳粉之表面官能基及粒徑尺寸 對超高電容特性的影響

為了解決中國碳素的問題，作者傅家容 這樣論述：

本研究是利用中國碳素鋼鐵公司提供之活性碳做為超高電容器的電極，並調控不同持溫的溫度、不同熱處理氣氛以及活性碳本身顆粒大小；藉以探討活性碳表面官能基和活性碳顆粒大小對超高電容器性質的影響，而其中電解液是選用商業上較常運用的1 M TEABF4/PC (Tetraethylammonium Tetrafluoroborate)/(Propylene Carbonate)做為電解液。 首先探討不同熱處理溫度對電容器的影響：本實驗在450 oC、600 oC、750 oC、850 oC、950 oC氮氣下進行熱處理，由材料分析能夠觀察到：隨著熱處理溫度提高，除了降低活性碳比表面積外、其表面含氧官能基

含量也隨之下降；在電化學分析方面，提高溫度江造成的比表面積減少，其結果反應在低速電容值的下降；然而表面含氧官能基含量的減少能增進電容器的耐用度(循環穩定性、高速穩定性、漏電流特性等)。根據上述實驗結果，進一步討論在750 oC下不同氣氛下進行熱處理對電容器的影響；比較N2、NO、NH3、Melamine等氣氛，預期透過氮摻雜提高電容器的性能。由材料分析中能發現：使用不同熱處理方式皆能有效的對碳材進行摻氮，其中以Melamine所摻雜之氮含量最多；電化學分析方面，顯現NO熱處理方式在穩定性上有較佳的表現。 另一方面，將不同粒徑分布的活性碳透過750 oC氮氣熱處理，試觀察不同粒徑尺寸對於超

高電容器性質的影響。在材料分析中能夠得知：隨著粒徑尺寸越小，其碳材表面所含氧官能基的量也越多，進而影響電容器的電化學性質(循環穩定性、高速穩定性、漏電流特性等)。